Extended depth of field and aberration control for inexpensive digital microscope systems

被引：102

作者：

Tucker, SC ^{[1
]}

Cathey, WT ^{[1
]}

Dowski, ER ^{[1
]}

机构：

[1] Univ Colorado, Dept Elect Engn, Imaging Syst Lab, Boulder, CO 80309 USA

来源：

OPTICS EXPRESS | 1999年 / 4卷 / 11期

关键词：

D O I：

10.1364/OE.4.000467

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a new application and current results for extending depth of field using wave front coding. A cubic phase plate is used to code wave fronts in microscopy resulting in extended depths of field and inexpensive chromatic aberration control. A review of the theory behind cubic phase plate extended depth of field systems is given along with the challenges that are face when applying the theory to microscopy. Current results from the new extended depth of field microscope systems are shown (C) 1998 Optical Society of America.

引用

页码：467 / 474

页数：8