On the Complexity of Wafer-to-Wafer Integration

被引:3
作者
Duvillie, Guillerme [1 ]
Bougeret, Marin [1 ]
Boudet, Vincent [1 ]
Dokka, Trivikram [2 ]
Giroudeau, Rodolphe [1 ]
机构
[1] Univ Montpellier 2, LIRMM, Montpellier, France
[2] Univ Lancaster, Dept Management Sci, Lancaster, England
来源
ALGORITHMS AND COMPLEXITY (CIAC 2015) | 2015年 / 9079卷
关键词
D O I
10.1007/978-3-319-18173-8_15
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
In this paper we consider the Wafer-to-Wafer Integration problem. A wafer is a p-dimensional binary vector. The input of this problem is described by m disjoints sets (called "lots"), where each set contains n wafers. The output of the problem is a set of n disjoint stacks, where a stack is a set of m wafers (one wafer from each lot). To each stack we associate a p-dimensional binary vector corresponding to the bit-wise AND operation of the wafers of the stack. The objective is to maximize the total number of "1" in the n stacks. We provide O(m(1-epsilon)) and O(p(1-epsilon)) non-approximability results even for n = 2, as well as a p/r-approximation algorithm for any constant r. Finally, we show that the problem is FPTwhen parameterized by p, and we use this FPTalgorithm to improve the running time of the p/r-approximation algorithm.
引用
收藏
页码:208 / 220
页数:13
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