Universal contact-line dynamics at the nanoscale

被引:12
作者
Rivetti, Marco [1 ]
Salez, Thomas [2 ]
Benzaquen, Michael [2 ]
Raphael, Elie [2 ]
Baeumchen, Oliver [1 ]
机构
[1] Max Planck Inst Dynam & Self Org MPIDS, D-37077 Gottingen, Germany
[2] PSL Res Univ, ESPCI ParisTech, UMR CNRS Gulliver 7083, Laboratoire Physicochim Theor, F-75005 Paris, France
关键词
Lubrication - Nanotechnology - Liquefied gases - Phase interfaces - Atomic force microscopy;
D O I
10.1039/c5sm01907a
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The relaxation dynamics of the contact angle between a viscous liquid and a smooth substrate is studied at the nanoscale. Through atomic force microscopy measurements of polystyrene nanostripes we simultaneously monitor both the temporal evolution of the liquid-air interface and the position of the contact line. The initial configuration exhibits high curvature gradients and a non-equilibrium contact angle that drive liquid flow. Both these conditions are relaxed to achieve the final state, leading to three successive regimes in time: (i) stationary contact line levelling; (ii) receding contact line dewetting; (iii) collapse of the two fronts. For the first regime, we reveal the existence of a self-similar evolution of the liquid interface, which is in excellent agreement with numerical calculations from a lubrication model. For different liquid viscosities and film thicknesses we provide evidence for a transition to dewetting featuring a universal critical contact angle and dimensionless time.
引用
收藏
页码:9247 / 9253
页数:7
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