Surface photovoltage analysis of ZnO nanorods/p-Si heterostructure

被引:4
作者
Kang, Dawei [1 ]
Bian, Jiming [1 ]
Sang, Yongchang [1 ]
Liu, Aimin [1 ]
Sun, Jingchang [2 ]
Xuan, Jun [1 ]
机构
[1] Dalian Univ Technol, Sch Phys & Optoelect Technol, Dalian 116024, Peoples R China
[2] Liaoning Normal Univ, Sch Phys & Elect Technol, Dalian 116029, Peoples R China
关键词
ZnO nanorod; Si; Surface photovoltage; Kelvin probe; PROBE FORCE MICROSCOPY; SOLAR-CELLS; SYSTEM;
D O I
10.1016/j.mssp.2012.10.016
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this work, n-type ZnO nanorods (NRs) were fabricated on a p-type Si substrate to form a ZnO NRs/Si structure using a low-temperature wet chemical bath deposition method. Kelvin-probe-based surface photovoltage (KP-based SPV) technology was used to study the behavior of surface photogenerated charges for the as-grown heterostructure. In general, the KP-based SW response range of the ZnO NRs/Si structure was significantly expanded compared with the bare Si substrate, due to the incorporation of ZnO NRs. Moreover, the SPV response amplitude for ZnO NRs/Si structure also depended on the length and diameter of the NRs, and the corresponding mechanism was elucidated in terms of O-2 adsorption. The photovoltaic application of the ZnO NRs/Si based structure would benefit significantly from these achievements. (C) 2012 Elsevier Ltd. All rights reserved.
引用
收藏
页码:520 / 524
页数:5
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