Device Noise in Continuous-Time Oversampling Converters

被引：3

作者：

Rajan, Radha S. ^{[1
]}

Pavan, Shanthi ^{[1
]}

机构：

[1] Indian Inst Technol, Dept Elect Engn, Madras 600036, Tamil Nadu, India

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS | 2012年 / 59卷 / 09期

关键词：

Aliasing; continuous time; modulator; noise analysis; NRZ; oversampling; return to open; sigma-delta; switched capacitor; time varying; SIGMA-DELTA-MODULATOR; CLOCK JITTER; FEEDBACK; DAC;

D O I：

10.1109/TCSI.2011.2180445

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We analyze the in-band thermal noise of continuous-time delta sigma modulators. The manifestation of noise in converters with time-invariant loop filters is straight forward and well known. However, several practically useful modulators, like those with switched-capacitor-resistor (SCR) and return-to-open (RTO) feedback DACs, have a time-varying loopfilter. We give a framework for analyzing the noise performance of such designs, and show that it is important to consider the aliasing of noise from around multiples of the sampling frequency. Our results compare well with those obtained from a circuit simulator.

引用

页码：1829 / 1840

页数：12

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