A high-resolution vacuum ultraviolet spectrometer for plasma spectroscopy

被引：6

作者：

Meijer, FG ^{[1
]}

机构：

[1] EURATOM, FOM, Inst Plasmafys Rijnhuizen, NL-3430 BE Nieuwegein, Netherlands

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 1999年 / 10卷 / 05期

关键词：

plasma rotation; plasma impurities; vacuum spectrometer; plasma diagnostics;

D O I：

10.1088/0957-0233/10/5/005

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A high-resolution spectrometer for the wavelength range 40-200 nm was adapted to a high-speed photo-electric detection system. A wavelength range of 3 nm can be measured up to every 0.2 ms with a resolution of 0.0012 nm and a wavelength accuracy of 0.0001 nm. The system is used for plasma spectroscopy at the Rijnhuizen Tokamak Project. Temperature measurements were performed with a resolution of 0.1 eV and changes in rotation velocity of 100 m s(-1) were observed.

引用

页码：367 / 373

页数：7

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