FTIR based process control for industrial reactors

被引:4
作者
Hopfe, V [1 ]
Grählert, W [1 ]
Throl, O [1 ]
机构
[1] Fraunhofer Inst Mat & Beam Technol, D-01277 Dresden, Germany
来源
JOURNAL DE PHYSIQUE IV | 1999年 / 9卷 / P8期
关键词
D O I
10.1051/jp4:19998124
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Aiming to process control of industrial high yield / high volume CVD reactors, the potential of Fourier transform infrared spectroscopy (FTIR) has been checked as a monitoring tool. Tin oxide deposition on glass by oxidation of dimethyl tin dichlorid in a cold-wall thermal CVD reactor was selected as test case. Four different FTIR monitoring modes have been evaluated and found feasible: transmission, (gas) emission, reflection and surface emission. The most detailed information of the composition of the gas atmosphere in the deposition zone is derived from the transmission and (gas) emission measurements. The emission mode is best suited for high temperature CVD reactors, needs only low effort for optical adaptation of the monitoring system but higher effort in data treatment for process control. Information on both gas composition and surface layer are derived from the reflection and the surface emission modes. Depending on the polarization stale of the surface emission, spectra contain information either on the sample surface only or on the reacting gas phase, too.
引用
收藏
页码:995 / 1002
页数:8
相关论文
共 10 条
[1]   THE USE OF INFRARED INTERFERENCE SPECTRA TO MEASURE CERAMIC COATING THICKNESS IN A CVD-REACTOR [J].
CLARK, TJ ;
BANASH, MA ;
CRUSE, RW ;
FECH, J ;
MININNI, RM ;
ROHMAN, SJ .
THIN SOLID FILMS, 1995, 254 (1-2) :7-9
[2]   Chemical vapor deposition of coatings on glass [J].
Gordon, R .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1997, 218 :81-91
[3]   IN-SITU MONITORING OF SELECTIVE COPPER DEPOSITION PROCESSES IN A METAL-ORGANIC CHEMICAL-VAPOR-DEPOSITION USING FOURIER-TRANSFORM INFRARED REFLECTION-ABSORPTION SPECTROSCOPY [J].
HANAOKA, K ;
OHNISHI, H ;
TACHIBANA, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (5A) :2430-2439
[4]   IN-SITU FTIR EMISSION-SPECTROSCOPY IN A TECHNOLOGICAL ENVIRONMENT - CHEMICAL-VAPOR INFILTRATION (CVI) OF SIC COMPOSITES [J].
HOPFE, V ;
MOSEBACH, H ;
ERHARD, M ;
MEYER, M .
JOURNAL OF MOLECULAR STRUCTURE, 1995, 347 :331-342
[5]   IN-SITU FILM THICKNESS MEASUREMENT AND GASEOUS SPECIES DETECTION IN DIAMOND CVD PROCESSES USING FTIR EMISSION-SPECTROSCOPY [J].
JIN, S ;
BOURGET, L ;
SEVILLANO, E .
SURFACE & COATINGS TECHNOLOGY, 1994, 68 :394-397
[6]   INSITU INFRARED REFLECTION AND TRANSMISSION ABSORPTION-SPECTROSCOPY STUDY OF SURFACE-REACTIONS IN SELECTIVE CHEMICAL-VAPOR DEPOSITION OF TUNGSTEN USING WF6 AND SIH4 [J].
KOBAYASHI, N ;
NAKAMURA, Y ;
GOTO, H ;
HOMMA, Y .
JOURNAL OF APPLIED PHYSICS, 1993, 73 (09) :4637-4643
[7]  
MCCURDY R, 1997, P 14 INT C EUROCVD 1, P463
[8]   INFRARED-ABSORPTION SPECTROSCOPY FOR MONITORING CONDENSABLE GASES IN CHEMICAL-VAPOR-DEPOSITION APPLICATIONS [J].
ONEILL, JA ;
PASSOW, ML ;
COTLER, TJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (03) :839-845
[9]  
Panczyk C, 1996, ELEC SOC S, V96, P183
[10]  
SANDERS HE, 1997, P 14 INT C EUROCVD 1, P81