High-resolution tracking with silicon strip detectors for relativistic ions

被引:5
作者
Hou, SR [1 ]
Alpat, B
Ambrosi, G
Balboni, C
Battiston, R
Burger, WJ
Chang, YH
Geissel, H
Ionica, M
Lustermann, W
Maehlum, G
Menichelli, M
Pauluzzi, M
Postolache, V
Produit, N
Rapin, D
Ren, D
Ribordy, M
Sann, H
Schardt, D
Sümmerer, K
Viertel, G
机构
[1] Natl Cent Univ, Chungli 320, Taiwan
[2] Ist Nazl Fis Nucl, Sez Perugia, I-06100 Perugia, Italy
[3] Univ Geneva, CH-1211 Geneva, Switzerland
[4] GSI Darmstadt, D-64291 Darmstadt, Germany
[5] ETH Zurich, CH-8093 Zurich, Switzerland
[6] IMT, Bucharest, Romania
[7] EPPG, Bucharest, Romania
关键词
D O I
10.1016/S0168-9002(99)00428-3
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Tracking with silicon strip detectors for relativistic ions has been investigated using a C-12 beam of 1.5 GeV/u at GSI. The ionization charge spectrum and the charge sharing between strips are presented. The strip cluster of carbon ion can be selected based on the cluster charge with high efficiency and little contamination. The spatial resolution of the silicon strip detectors is evaluated. The angular distribution of multiple Coulomb scattering was investigated with lead absorbers. The results are compared to the Moliere theory and the Gaussian approximation of GEANT calculations. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:169 / 177
页数:9
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