Positioning resolution of the position-sensitive detectors in high background illumination

被引:21
作者
Makynen, A
Kostamovaara, J
Myllyla, R
机构
[1] Electronics Laboratory, University of Oulu, Oulu
关键词
Optical resolving power - Signal to noise ratio - Spurious signal noise;
D O I
10.1109/19.481361
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The effect of high background illumination on the positioning resolution of the LEP and 4Q detector is studied. High background illumination lowers the noise sensitivity of the LEP, whereas the noise sensitivity of the 4Q detector remains unchanged. The noise sensitivity drop roughly from 0.5 to 0.3 was demonstrated in the case of the LEP. This means that by using an LEP instead of a 4Q detector, better resolution in high background illumination could be achieved despite the higher inherent noise level of it.
引用
收藏
页码:324 / 326
页数:3
相关论文
共 7 条
[2]   NOISE AND FREQUENCY-RESPONSE OF SILICON PHOTODIODE OPERATIONAL AMPLIFIER COMBINATION [J].
HAMSTRA, RH ;
WENDLAND, P .
APPLIED OPTICS, 1972, 11 (07) :1539-&
[3]  
MAKYNEN AJ, 1991, INT S MICRO, V9, P275
[4]   THE LINEARITY AND SENSITIVITY OF LATERAL EFFECT POSITION-SENSITIVE DEVICES - AN IMPROVED GEOMETRY [J].
WANG, WJ ;
BUSCHVISHNIAC, IJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1989, 36 (11) :2475-2480
[5]   SINGLE-AXIS AND DUAL-AXIS LATERAL PHOTODETECTORS OF RECTANGULAR SHAPE [J].
WOLTRING, HJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1975, 22 (08) :581-590
[6]  
YANHAI Y, 1986, OPT LASER TECHNOL, V18, P75
[7]  
Young P. W., 1986, Proceedings of the SPIE - The International Society for Optical Engineering, V616, P118, DOI 10.1117/12.961045