On-Line Semiconductor Switching Loss Measurement System for an Advanced Condition Monitoring Concept

被引：0

作者：

Krone, Tobias ^{[1
]}

Hung, Lan Dang ^{[1
]}

Jung, Marco ^{[2
]}

Mertens, Axel ^{[1
]}

机构：

[1] Leibniz Univ Hannover, Inst Drive Syst & Power Elect, D-30167 Hannover, Germany

[2] Fraunhofer Inst Wind Energy & Energy Syst Technol, Konigstor 59, D-34119 Kassel, Germany

来源：

2016 18TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS (EPE'16 ECCE EUROPE) | 2016年

关键词：

Switching losses; Current sensor; Diagnostics; Reliability; IGBT; Wind energy;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, an FPGA-based on-line switching loss measurement system for an advanced condition monitoring system is presented. For this purpose, an on-line measurement system for the semiconductor voltage and current transients integrated at the gate-driver voltage level is proposed. This system and the switching loss calculations are verified by experimental results.

引用

页数：10

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