Optomechanical Design of a Multilayer Laue Lens Test Bed for 10-nm Focusing of Hard X-rays

被引:12
作者
Shu, Deming [1 ]
Nazaretski, Evgeny
Kim, Jungdae
Yan, Hanfei
Lauer, Kenneth
Mullany, Brian
Kuhne, Dennis
Maser, Joerg [1 ]
Chu, Yong S.
机构
[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
来源
11TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY (XRM2012) | 2013年 / 463卷
关键词
D O I
10.1088/1742-6596/463/1/012029
中图分类号
TH742 [显微镜];
学科分类号
摘要
A multilayer Laue lens (MLL) test bed was designed at the Argonne National Laboratory for the National Synchrotron Light Source-II (NSLS-II) project at Brookhaven National Laboratory. Argonne and Brookhaven scientists and engineers collaborated to carry out this work in order to achieve NSLS-II's R&D goals of 10-nm focusing of hard x-rays. The test-bed design was based on the experience gained from the Argonne nanopositioning system designed for the CNM/APS hard x-ray nanoprobe project and an MLL test bed at Advanced Photon Source (APS) beamline 26-ID [1-3]. Optomechanical design of the MLL test bed, as well as the preliminary test results for the alignment apparatus and sample base stages' mechanical vibration performances are presented in this paper.
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页数:4
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