Timing Speculation With Optimal In Situ Monitoring Placement and Within-Cycle Error Prevention

被引:1
作者
Balef, Hadi Ahmadi [1 ]
Fatemi, Hamed [2 ]
Goossens, Kees [1 ]
de Gyvez, Jose Pineda [2 ,3 ]
机构
[1] Eindhoven Univ Technol, Dept Elect Engn, NL-5612 AP Eindhoven, Netherlands
[2] NXP Semicond, High Tech Campus, NL-5656 AE Eindhoven, Netherlands
[3] Eindhoven Univ Technol, Dept Elect Engn, NL-5612 AP Eindhoven, Netherlands
关键词
in situ delay monitoring; timing error; timing speculation (TS); variation resilience; PREDICTION;
D O I
10.1109/TVLSI.2019.2895972
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, a timing speculation technique with low-overhead in situ delay monitors placed along critical paths is presented. The proposed insertion of monitors enables timing error prevention within the same clock cycle. Compared to other techniques, the design cost per monitor in our technique is low because no additional gates for the guard banding, inspection window generation, and short path extension are required. We benchmarked our approach on an ARM Cortex M0. The insertion strategy reduces the number of monitors by up to similar to 23x, power by similar to 5.5x, and area by similar to 2.8x compared to the traditional in situ monitoring techniques that insert monitors at the flip-flops. The timing error correction uses a global clock stretching unit to prevent errors within one cycle. With the proposed error prevention technique, similar to 22% more delay variation is tolerated with a negligible energy overhead of less than similar to 1%.
引用
收藏
页码:1206 / 1217
页数:12
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