Characterization of grain boundaries of Al-doped sintered β-SiC by both HRTEM and STEM

Both high-resolution transmission electron microscope (HRTEM) and scanning transmission electron microscope (STEM) were carried out to observe the structure and chemistry of grain boundaries of Al-doped sintered beta-SIC. Two specimens, an as-sintered and an compressed Al-doped sintered beta-SiC specimens, were provided. Although, it was shown by energy dispersive X-ray spectroscopy (EDS) that Al and O segregated at grain boundaries of both specimens, it was discovered by electron energy loss spectroscopy (EELS) that the chemistry of grain boundaries of both specimens were different.