Life test evaluation of 411M cathode for highly reliable satellite TWTs

被引：8

作者：

Chiba, A ^{[1
]}

Akiyama, Y ^{[1
]}

机构：

[1] NEC Corp Ltd, Microwave Tube Div, Sagamihara, Kanagawa 2291198, Japan

来源：

APPLIED SURFACE SCIENCE | 1999年 / 146卷 / 1-4期

关键词：

M cathode; life; low temperature techniques; microwave tubes; traveling-wave tubes; work function;

D O I：

10.1016/S0169-4332(99)00002-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We evaluated 218 411M cathodes in a cathode test tube (CTT) through continuous operation. These cathodes have been evaluated at four operating temperatures between 910 and 1100 Cb, and six types of current density from 0.6 to 5.0 A/cm(2) for 100,000 h or mon. The total accumulated life test time was 7,513,100 h. We formulated a life prediction model based on optimum operating temperature and cathode current density. The results of evaluation verified the validity of the Life prediction model, which showed that the 411M cathode has a life of more than 200,000 h (22.8 years) at a current density of less than 2.0 A/cm(2). (C) 1999 Published by Elsevier Science B.V. All rights reserved.

引用

页码：120 / 125

页数：6