Investigating the Surface Morphology and Magnetic Contrast of Epitaxial Ferromagnetic Structures

被引：5

作者：

Fomin, L. A. ^{[1
]}

Malikov, I. V. ^{[1
]}

Vinnichenko, V. Yu. ^{[1
]}

Kalach, K. M. ^{[1
]}

Pyatkin, S. V. ^{[1
]}

Mikhailov, G. M. ^{[1
]}

机构：

[1] Russian Acad Sci, Inst Microelect Technol & High Pur Mat, Chernogolovka 142432, Moscow Region, Russia

来源：

JOURNAL OF SURFACE INVESTIGATION-X-RAY SYNCHROTRON AND NEUTRON TECHNIQUES | 2008年 / 2卷 / 01期

基金：

俄罗斯基础研究基金会;

关键词：

D O I：

10.1134/S1027451008010151

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The surface morphology of nickel thin films is investigated via atomic force microscopy. The multistage film growth mechanism is found to be dependent on substrate temperature and film thickness. It is shown that conduction electron scattering from the irregularities of the outer and inner surfaces of structures are influenced by the surface morphology and determined by an integrated contribution of the surface's fluctuation density spectrum. The morphology influence can be decreased under certain growth conditions so that the residual mean free path of conduction electrons can reach 1000 nm, exceeding the film thickness. Epitaxial nanostructures with high electron mobility have been fabricated. Investigation of their magnetic structure has shown that their magnetic domain dimensions are less than the residual mean free path of electrons determined by the surface morphology.

引用

页码：104 / 109

页数：6

共 12 条

[1] Electronic transport in ultrathin magnetic multilayers [J].

Barnas, J ;

Bruynseraede, Y .

PHYSICAL REVIEW B, 1996, 53 (09) :5449-5460

[2] INFLUENCE OF SURFACE-ROUGHNESS ON THE CONDUCTIVITY OF METALLIC AND SEMICONDUCTING QUASI-2-DIMENSIONAL STRUCTURES [J].

FISHMAN, G ;

CALECKI, D .

PHYSICAL REVIEW B, 1991, 43 (14) :11581-11585

[3]

FOMIN LA, 2006, NEW NANOTECHNOLOGY R

[4]

MALIKOV IV, 2006, NANOPHYSICS NANOELEC, P289

[5]

MALIKOV IV, 2005, NANOPHYSICS NANOELEC, P186

[6]

Mikhailov GM, 2002, PHYS LOW-DIMENS STR, V1-2, P1

[7] Electrical conductivity and thin-film growth dynamics [J].

Palasantzas, G ;

Zhao, YP ;

Wang, GC ;

Lu, TM ;

Barnas, J ;

De Hosson, JTM .

PHYSICAL REVIEW B, 2000, 61 (16) :11109-11117

[8] ROUGHNESS SPECTRUM AND SURFACE WIDTH OF SELF-AFFINE FRACTAL SURFACES VIA THE K-CORRELATION MODEL [J].

PALASANTZAS, G .

PHYSICAL REVIEW B, 1993, 48 (19) :14472-14478

[9] Surface-roughness fractality effects in electrical conductivity of single metallic and semiconducting films [J].

Palasantzas, G ;

Barnas, J .

PHYSICAL REVIEW B, 1997, 56 (12) :7726-7731

[10]

ROUKES ML, 1990, NATO ADV SCI I B-PHY, V231, P95

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