A 3.25Gb/s injection locked CMOS clock recovery cell

被引:5
作者
Gabara, T [1 ]
机构
[1] AT&T Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
来源
PROCEEDINGS OF THE IEEE 1999 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 1999年
关键词
D O I
10.1109/CICC.1999.777335
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A clock signal embedded in a NRZ (Non Return to Zero) 2(31)-1 pseudo-random data stream is used to injection lock a slave CMOS LC tank circuit. The slave oscillator in turn generates a clock signal responsive to this stimulus and is used to capture the data. A measured Bit Error Rate (BER) of less than 2E-15 at 3Gb/s is achieved using conventional 0.25 mu m CMOS and dissipating less than 50mW. Differential clock recovery can be performed with as little as four active devices.
引用
收藏
页码:521 / 524
页数:4
相关论文
共 17 条
[1]   A STUDY OF LOCKING PHENOMENA IN OSCILLATORS [J].
ADLER, R .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1946, 34 (06) :351-357
[2]  
BENNETT WR, 1958, AT&T TECH J, P1501
[3]   LARGE SUSPENDED INDUCTORS ON SILICON AND THEIR USE IN A 2-MU-M CMOS RF AMPLIFIER [J].
CHANG, JYC ;
ABIDI, AA ;
GAITAN, M .
IEEE ELECTRON DEVICE LETTERS, 1993, 14 (05) :246-248
[4]  
CRANINCKX J, 1995, ISSCC, P266
[5]   LVDS I/O buffers with a controlled reference circuit [J].
Gabara, T ;
Fischer, W ;
Werner, W ;
Siegel, S ;
Kothandaraman, M ;
Metz, P ;
Gradl, D .
TENTH ANNUAL IEEE INTERNATIONAL ASIC CONFERENCE AND EXHIBIT, PROCEEDINGS, 1997, :311-315
[6]   SYNCHRONIZATION OF OSCILLATORS [J].
HUNTOON, RD ;
WEISS, A .
PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1947, 35 (12) :1415-1423
[7]  
KINGET P, 1998, ISSCC, P226
[8]   RF-CMOS oscillators with switched tuning [J].
Kral, A ;
Behbahani, F ;
Abidi, AA .
IEEE 1998 CUSTOM INTEGRATED CIRCUITS CONFERENCE - PROCEEDINGS, 1998, :555-558
[9]   SI IC-COMPATIBLE INDUCTORS AND LC PASSIVE FILTERS [J].
NGUYEN, NM ;
MEYER, RG .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1990, 25 (04) :1028-1031
[10]   INJECTION LOCKING OF OSCILLATORS [J].
PACIOREK, LJ .
PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1965, 53 (11) :1723-&