Structural and Spectroscopic Properties of a 2 Inch ZnO-on-Sapphire Epiwafer Grown by Using Molecular Beam Epitaxy

被引:2
作者
Robin, I. C. [1 ]
Tavares, C. [1 ]
Rothman, J. [1 ]
Feuillet, G. [1 ]
El-Shaer, A. H. [2 ]
Bakin, A. [2 ]
Waag, A. [2 ]
Dang, Le Si [3 ]
机构
[1] DOPT, Leti MINATEC, CEA Grenoble, F-38054 Grenoble 9, France
[2] Tech Univ Carolo Wilhelmina Braunschweig, Inst Semicond Technol, D-38106 Braunschweig, Germany
[3] CNRS, Inst Neel, F-38042 Grenoble, France
关键词
ZnO; Molecular beam epitaxy; Time-resolved photoluminescence; Cathodoluminescence;
D O I
10.3938/jkps.53.2877
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The structural and the spectroscopic properties of a 2-inch ZnO epilayer grown by using molecular beam epitaxy are investigated. A 500-nm-thick substrate was grown on c-sappire by using a MgO buffer. In spite of the high dislocation density in the epilayer, temperature-dependent photoluminescence measurements show only a small decrease in the luminescence intensity between 4 K and 300 K. Time-resolved photoluminescence measurements reveal a decay time independent of temperature. Cathodoluminescence presents an inhomogeneous emission on a micrometric scale: a stronger emission is measured in small nanometric areas. A tentative explanation of this behavior is proposed.
引用
收藏
页码:2877 / 2879
页数:3
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