A study on temperature distribution of arc cross section of low-voltage apparatus

被引：0
|
作者：
Liu, JM [1 ]
Zha, J [1 ]
Tan, BH [1 ]
Wang, ZZ [1 ]
机构：
[1] Heibei Univ Technol, Tianjin 300130, Peoples R China
来源：
PROCEEDINGS OF 2005 INTERNATIONAL CONFERENCE ON MACHINE LEARNING AND CYBERNETICS, VOLS 1-9 | 2005年
关键词：
low voltage apparatus; switching are; temperature field; CCD; computer tomogram;
D O I：
暂无
中图分类号：
TP18 [人工智能理论];
学科分类号：
081104 ; 0812 ; 0835 ; 1405 ;
摘要：
In this paper, a set of hardware instruments used to collect arc radiant intensity in three directions were designed by using single area CCD based on high temperature characteristic of low-voltage apparatus switch arc, and the principle of computer tomogram and corresponding image processing software was also developed. We took pictures for the projection of breaking arc radiation of the low-voltage AC contactor in inductance circuits, and rebuilt its temperature distribution on different sections when burning.
引用
收藏
页码：315 / 320
页数：6
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