Data analytics using canonical correlation analysis and Monte Carlo simulation

被引:17
|
作者
Rickman, Jeffrey M. [1 ,2 ]
Wang, Yan [2 ]
Rollett, Anthony D. [3 ]
Harmer, Martin P. [2 ]
Compson, Charles [4 ]
机构
[1] Lehigh Univ, Dept Phys, Bldg 16, Bethlehem, PA 18015 USA
[2] Lehigh Univ, Dept Mat Sci & Engn, Bethlehem, PA 18015 USA
[3] Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA
[4] Almatis Inc, Leetsdale, PA 15056 USA
关键词
CREEP-PROPERTIES; NEURAL-NETWORKS;
D O I
10.1038/s41524-017-0028-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A canonical correlation analysis is a generic parametric model used in the statistical analysis of data involving interrelated or interdependent input and output variables. It is especially useful in data analytics as a dimensional reduction strategy that simplifies a complex, multidimensional parameter space by identifying a relatively few combinations of variables that are maximally correlated. One shortcoming of the canonical correlation analysis, however, is that it provides only a linear combination of variables that maximizes these correlations. With this in mind, we describe here a versatile, Monte-Carlo based methodology that is useful in identifying non-linear functions of the variables that lead to strong input/output correlations. We demonstrate that our approach leads to a substantial enhancement of correlations, as illustrated by two experimental applications of substantial interest to the materials science community, namely: (1) determining the interdependence of processing and microstructural variables associated with doped polycrystalline aluminas, and (2) relating microstructural decriptors to the electrical and optoelectronic properties of thin-film solar cells based on CuInSe2 absorbers. Finally, we describe how this approach facilitates experimental planning and process control.
引用
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页数:6
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