Moisture dependent wear mechanisms of gallium nitride

被引:22
作者
Zeng, Guosong [1 ,2 ]
Tansu, Nelson [2 ,3 ]
Krick, Brandon A. [1 ]
机构
[1] Lehigh Univ, Dept Mech Engn & Mech, Bethlehem, PA 18015 USA
[2] Lehigh Univ, Ctr Photon & Nanoelect, Bethlehem, PA 18015 USA
[3] Lehigh Univ, Dept Elect & Comp Engn, Bethlehem, PA 18015 USA
基金
美国国家科学基金会;
关键词
Tribochemistry; Wear mechanism; Humidity; GaN; LIGHT-EMITTING-DIODES; TRIBOCHEMICAL WEAR; SILICON-NITRIDE; GAN; SAPPHIRE; HUMIDITY; FRICTION; BULK; PHOTOLUMINESCENCE; MECHANOCHEMISTRY;
D O I
10.1016/j.triboint.2017.09.018
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
Ultralow wear nature of gallium nitride (GaN) has been revealed recently. The wear rate for GaN has a significant dependence on humidity, ranging from 9 x 10(-9) mm(3)/Nm to 9.5 x 10(-7) mm(3)/Nm; the mechanisms responsible for this variation in wear remain unclear. Here, we performed reciprocal sliding test on GaN under different environments and characterized the chemical compositions of corresponding worn surface by energy dispersive Xray spectroscopy (EDS). We show that the surface chemistry of GaN responded differently to various testing environments; this gave rise to the wear rate of GaN spanning over orders of magnitude. Additionally, the EDS conducted on the countersample (alumina probe) clearly evidenced a material transfer from GaN to the ruby countersample. Atomic force microscopy (AFM) and secondary electron microscopy (SEM) inside the wear scar indicated a grooving abrasion wear mechanism of GaN tested under humid environment and adhesive wear mechanism for dry nitrogen testing environment; this is confirmed by SEM/EDS of the ruby probes. In addition, transmission electron microscopy (TEM) was employed to image the defects formed underneath the worn surface, due to the tribological sliding, and the results suggested a possible evolution of wear debris formation.
引用
收藏
页码:120 / 127
页数:8
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