Relaxation process of the self-trapping exciton in C-60

被引:22
作者
Sun, X
Zhang, GP
Ma, YS
Fu, RL
Shen, XC
Lee, KH
Park, TY
George, TF
Pandey, LN
机构
[1] ACAD SINICA,NATL LAB INFRARED PHYS,SHANGHAI 200083,PEOPLES R CHINA
[2] WON KWANG UNIV,DEPT CHEM,IKSAN 570749,SOUTH KOREA
[3] WON KWANG UNIV,DEPT EDUC PHYS,IKSAN 570749,SOUTH KOREA
[4] WASHINGTON STATE UNIV,DEPT CHEM,PULLMAN,WA 99164
[5] WASHINGTON STATE UNIV,DEPT PHYS,PULLMAN,WA 99164
来源
PHYSICAL REVIEW B | 1996年 / 53卷 / 23期
关键词
D O I
10.1103/PhysRevB.53.15481
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
When C-60 is photoexcited, a self-trapping exciton (STE) is formed: The bond structure is distorted from symmetry I-h to D-5d while the states A(1u) and A(2u) are pulled into the energy gap from highest occupied molecular orbital and lowest unoccupied molecular orbital, respectively. A dynamical scheme is employed to simulate the relaxation process of STE. The evolution of both bond structure and electronic states shows that the relaxation time to form STE is about 100 fs. It should be noted that this relaxation time is much shorter than that of charge transfer in C-60. The origin for this large difference is discussed.
引用
收藏
页码:15481 / 15484
页数:4
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