A multiscale coupled finite-element and phase-field framework to modeling stressed grain growth in polycrystalline thin films

被引:21
作者
Jamshidian, M. [1 ,3 ]
Thamburaja, P. [2 ]
Rabczuk, T. [4 ,5 ]
机构
[1] Isfahan Univ Technol, Dept Mech Engn, Esfahan 8415683111, Iran
[2] UKM, Dept Mech & Mat Engn, Bangi 43600, Malaysia
[3] Bauhaus Univ Weimar, Inst Struct Mech, Marienstr 15, D-99423 Weimar, Germany
[4] Ton Duc Thang Univ, Div Computat Mech, Ho Chi Minh City, Vietnam
[5] Ton Duc Thang Univ, Fac Civil Engn, Ho Chi Minh City, Vietnam
关键词
Grain growth; Polycrystalline thin film; Constitutive modeling; Numerical simulations; Phase-field method; Finite element method; DEPENDENT SURFACE-ENERGY; INTERFACE MOTION; SIMULATION; EVOLUTION; TEXTURE; MIGRATION; LENGTH;
D O I
10.1016/j.jcp.2016.09.061
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
A previously-developed finite-deformation-and crystal-elasticity-based constitutive theory for stressed grain growth in cubic polycrystalline bodies has been augmented to include a description of excess surface energy and grain-growth stagnation mechanisms through the use of surface effect state variables in a thermodynamically-consistent manner. The constitutive theory was also implemented into a multiscale coupled finite-element and phase-field computational framework. With the material parameters in the constitutive theory suitably calibrated, our three-dimensional numerical simulations show that the constitutive model is able to accurately predict the experimentally-determined evolution of crystallographic texture and grain size statistics in polycrystalline copper thin films deposited on polyimide substrate and annealed at high-homologous temperatures. In particular, our numerical analyses show that the broad texture transition observed in the annealing experiments of polycrystalline thin films is caused by grain growth stagnation mechanisms. (C) 2016 Elsevier Inc. All rights reserved.
引用
收藏
页码:779 / 798
页数:20
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