Characterization of molecular assemblies on silicon surfaces by attenuated total reflectance infrared spectroscopy

被引:13
|
作者
Ara, M [1 ]
Yamada, R
Tada, H
机构
[1] Inst Mol Sci, Okazaki, Aichi 448787, Japan
[2] CREST, Japan Sci & Technol Agcy, Kawaguchi 3320012, Japan
关键词
monolayer; Si-C; Si(111); attenuated total reflectance infrared spectroscopy (ATR-IR);
D O I
10.1016/j.tsf.2005.07.045
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Alkyl monolayers anchored to Si(111) were prepared in diluted and neat I-alkene by thermal reaction. Monolayers prepared were investigated by attenuated total reflectance infrared spectroscopy. It was found that alkyl chains in the monolayers anchored to Si(111) had an all-trans conformation. Monolayers prepared in diluted l-alkene were identical with that prepared in neat I -alkene. The rate of reaction between l-alkene and hydrogen-terminated silicon remarkably depended on the concentration of l-alkene. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:8 / 12
页数:5
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