Calibration of coercive and stray fields of commercial magnetic force microscope probes

被引：40

作者：

Jaafar, Miriam ^{[1
]}

Asenjo, Agustina ^{[1
]}

Vazquez, Manuel ^{[1
]}

机构：

[1] CSIC, Inst Ciencia Mat Madrid, E-28049 Madrid, Spain

来源：

IEEE TRANSACTIONS ON NANOTECHNOLOGY | 2008年 / 7卷 / 03期

关键词：

coercive field; magnetic force microscopy (MFM) probes; stray field;

D O I：

10.1109/TNANO.2008.917785

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Variable-field magnetic force microscope (MFM) is introduced to characterize the magnetic behavior of commercially available MFM probes that is relevant to interpret MFM imaging. A Nanotec Electronica S.L. microscope has been conveniently modified to apply magnetic fields in axial direction (up to 1.5 kOe) and in-plane direction (up to 2.0 kOe). Axial and transeverse hysteresis loops of the probes have been generated by measuring the changes in the MFM contrast observed when the magnetic field is applied. The variation of the MFM signal is ascribed to the modification of the magnetic state of the tips. This is enabled by the large coercitivity (similar to 1.7 kOe) of the checked longitudinal recording media. The properties of the probes depend on the coating material, the macroscopic tip shape, and tip radius. In only a few cases, the magnetization of the probe can be oriented along in-plane orientation. In addition, the stray field of the tips has been deduced by measuring the influence of the probe in the magnetic state of the checked samples.

引用

页码：245 / 250

页数：6

共 26 条

[1] Quantitative magnetic force microscopy analysis of the magnetization process in nanowire arrays [J].

Asenjo, A. ;

Jaafar, M. ;

Navas, D. ;

Vazquez, M. .

JOURNAL OF APPLIED PHYSICS, 2006, 100 (02)

[2] Magnetic force microscopy study of dense stripe domains in Fe-B/Co-Si-B multilayers and the evolution under an external applied field [J].

Asenjo, A ;

García, D ;

García, JM ;

Prados, C ;

Vázquez, M .

PHYSICAL REVIEW B, 2000, 62 (10) :6538-6544

[3] Field-dependence of microscopic probes in magnetic force microscopy [J].

Babcock, KL ;

Elings, VB ;

Shi, J ;

Awschalom, DD ;

Dugas, M .

APPLIED PHYSICS LETTERS, 1996, 69 (05) :705-707

[4] Magnetization reversal and coercivity of magnetic-force microscopy tips [J].

Carl, A ;

Lohau, J ;

Kirsch, S ;

Wassermann, EF .

JOURNAL OF APPLIED PHYSICS, 2001, 89 (11) :6098-6104

[5] Remanence of Ni nanowire arrays:: Influence of size and labyrinth magnetic structure [J].

Escrig, J. ;

Altbir, D. ;

Jaafar, M. ;

Navas, D. ;

Asenjo, A. ;

Vazquez, M. .

PHYSICAL REVIEW B, 2007, 75 (18)

[6] Characterisation of MFM tip fields by electron tomography [J].

Ferrier, RP ;

McVitie, S ;

Gallagher, A ;

Nicholson, WAP .

IEEE TRANSACTIONS ON MAGNETICS, 1997, 33 (05) :4062-4064

[7] Perforated tips for high-resolution in-plane magnetic force microscopy [J].

Folks, L ;

Best, ME ;

Rice, PM ;

Terris, BD ;

Weller, D ;

Chapman, JN .

APPLIED PHYSICS LETTERS, 2000, 76 (07) :909-911

[8] Magnetic nanoparticle array with perpendicular crystal magnetic anisotropy [J].

Haginoya, C ;

Heike, S ;

Ishibashi, M ;

Nakamura, K ;

Koike, K ;

Yoshimura, T ;

Yamamoto, J ;

Hirayama, Y .

JOURNAL OF APPLIED PHYSICS, 1999, 85 (12) :8327-8331

[9] THE POINT DIPOLE APPROXIMATION IN MAGNETIC FORCE MICROSCOPY [J].

HARTMANN, U .

PHYSICS LETTERS A, 1989, 137 (09) :475-478

[10] Magnetic force microscopy study of interactions in 100 nm period nanomagnet arrays [J].

Hwang, M ;

Abraham, MC ;

Savas, TA ;

Smith, HI ;

Ram, RJ ;

Ross, CA .

JOURNAL OF APPLIED PHYSICS, 2000, 87 (09) :5108-5110

← 1 2 3 →