A new Cu Kα2-elimination algorithm

This paper presents a new algorithm to remove the Cu K alpha(2) profile in X-ray powder diffraction patterns. Previous algorithms for alpha(2) elimination can be divided into two categories. The first category assumes the shape identity of the alpha(1) and alpha(2) components. The second category uses parameters by fitting experimental data. The first category is not accurate and the second one is instrument-dependent. The algorithm presented here uses the Cu K alpha emission profile obtained from monolithic double-crystal measurements. Therefore, it is more accurate and less instrument-dependent than the previous methods. This algorithm has been tested and applied in software for diffraction data processing. The present method can be extended to remove K alpha(2) lines of other radiations.