Conical face-field electrostatic energy analyzers for investigating nanomaterials

被引：0
作者：
Ilyin, A. M. [1 ]
Guseinov, N. R. [1 ]
Tulegenova, M. A. [1 ]
机构：
[1] Al Farabi Kazakh Natl Univ, Al Farabi Ave 71, Alma Ata 050040, Kazakhstan
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2022年 / 257卷
关键词：
Electrostatic energy analyzers; Conical face-field; Fringing fields; Nanomaterials; Remote objects; FOCUSING PROPERTIES; SURFACE-ANALYSIS; SPACE PLASMAS; SPECTROSCOPY; SIMULATION; DESIGN;
D O I：
10.1016/j.elspec.2022.147203
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
The paper presents numerically calculated models of new electrostatic energy analyzers based on a conical facefield, which is restricted by concentric cylindrical (inner) and truncated-cone (outer) electrodes and two flat boundaries, perpendicular to the axis of symmetry. The calculated analyzers show good enough as energy resolution as well the acceptance characteristics, simple design ( without fringing fields) and provide wide abilities for analyzing surfaces of remote objects of different shape and size. Remote sensing allows use in various applications when is desirable to use a set of methods without mutual interference, what is useful tool's characteristic for investigating nanostructures.
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页数：5
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[71]   Top hat electrostatic analyzer for far-field electric propulsion plume diagnostics [J].
Victor, AL ;
Zurbuchen, TH ;
Gallimore, AD .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (01) :1-7
[72]   Simulation of Electron Spectra for Surface Analysis (SESSA)for quantitative interpretation of (hard) X-ray photoelectron spectra(HAXPES) [J].
Werner, Wolfgang S. M. ;
Smekal, Werner ;
Hisch, Thomas ;
Himmelsbach, Julia ;
Powell, Cedric J. .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2013, 190 :137-143
[73]   Electron transport for spectrum analysis and experiment design [J].
Werner, Wolfgang S. M. .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2010, 178 :154-177
[74]   Monitoring electron-beam irradiation effects on graphenes by temporal Auger electron spectroscopy [J].
Xu, Mingsheng ;
Fujita, Daisuke ;
Hanagata, Nobutaka .
NANOTECHNOLOGY, 2010, 21 (26)
[75]   Auger Electron Spectroscopy: A Rational Method for Determining Thickness of Graphene Films [J].
Xu, Mingsheng ;
Fujita, Daisuke ;
Gao, Jianhua ;
Hanagata, Nobutaka .
ACS NANO, 2010, 4 (05) :2937-2945
[76]   Fringing field correction of the second-order angular aberration in sector field electron energy analyzers [J].
Yavor, M. I. ;
Belov, V. D. ;
Pomozov, T. V. .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 2008, 168 (1-3) :29-33
[77]   Auger Electron Spectroscopy in high vacuum: Nanocharacterisation in the Scanning Electron Microscope [J].
Zha, Xiaoping ;
Walker, Christopher G. H. ;
El-Gomati, Mohamed .
ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2013 (EMAG2013), 2014, 522
[78]   Design and calibration of a retarding field energy analyzer for the LTX-β scrape off layer and modeling of electrostatic potential in a collisionless SOL [J].
Zhang, X. ;
Elliot, D. B. ;
Maan, A. ;
Boyle, D. P. ;
Kaita, R. ;
Majeski, R. .
NUCLEAR MATERIALS AND ENERGY, 2019, 19 :250-254
[79]   Optimal energy resolution of a hemispherical analyzer with virtual entry [J].
Zouros, TJM ;
Benis, EP .
APPLIED PHYSICS LETTERS, 2005, 86 (09) :1-3
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