Effect of Annealing on Structure and Magneto-Transport Properties of Fe/Au Multilayer

被引：0
作者：
Singh, Surendra [1 ]
Basu, Saibal [1 ]
Prajapat, C. L.
Gupta, M.
机构：
[1] Bhabha Atom Res Ctr, Div Solid State Phys, Bombay 400085, Maharashtra, India
来源：
SOLID STATE PHYSICS, VOL 57 | 2013年 / 1512卷
关键词：
magnetoresistance; x-ray reflectivity; MAGNETORESISTANCE; SUPERLATTICES; SURFACES;
D O I：
10.1063/1.4791245
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have studied the effect of annealing on magnetotransport in Fe/Au multilayers grown on Si substrate by sputtering. The multilayer interface structure was studied by specular and off-specular x-ray reflectometry whereas macroscopic magnetic properties are studied using SQUID magnetometer. We observed a reduction in magnetoresistance on annealing film at low temperature of 100 and 150 degrees C. Reduction in magnetoresistance is attributed to increase in interface roughness as observed in x-ray reflectivity measurements.
引用
收藏
页码：730 / 731
页数：2
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