Surface roughness interpretation of 730 kg days CRESST-II results

被引:26
|
作者
Kuzniak, M. [1 ]
Boulay, M. G. [1 ]
Pollmann, T. [1 ]
机构
[1] Queens Univ, Dept Phys, Kingston, ON K7L 3N6, Canada
关键词
Dark Matter; WIMP; CRESST; Low background; Surface roughness; Sputtering; Po-210; MATTER; CAWO4;
D O I
10.1016/j.astropartphys.2012.05.005
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
The analysis presented in the recent publication of the CRESST-II results [1] finds a statistically significant excess of registered events over known background contributions in the acceptance region and attributes the excess to a possible Dark Matter signal, caused by scattering of rather light WIMPs. We propose a mechanism which explains the excess events with ion sputtering caused by Pb-206 recoils and alpha-particles from Po-210 decay, combined with realistic surface roughness effects. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:77 / 82
页数:6
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