Post-annealing Effect on Surface Wettability by Electron Beam Evaporated Ag/In2O3 Thin Films

被引：1
|
作者：
Nath, Amitabha [1 ]
Chakraborty, Amanisha [1 ]
Das, Abhijit [1 ]
Singh, Laishram Robindro [2 ]
Sarkar, Mitra Barun [1 ]
机构：
[1] Natl Inst Technol Agartala, Dept Elect & Commun Engn, Jirania 799046, India
[2] North Eastern Hill Univ, Dept Nanotechnol, Shillong 793022, Meghalaya, India
来源：
BRAZILIAN JOURNAL OF PHYSICS | 2022年 / 52卷 / 06期
关键词：
In2O3; Ag; Thin films; Contact angle; Surface wettability; NANOWIRES; GROWTH;
D O I：
10.1007/s13538-022-01207-3
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Effect of post-annealing on surface wettability were reported by Ag/In2O3 thin films. Ag and In2O3 thin films were synthesized by a high-vacuum coating unit with an electron beam power supply. The prepared samples were annealed at 800 degrees C to check out the surface modifications. The field emission scanning electron microscopy (FESEM) and atomic force microscopy (AFM) measurement were performed to analyze the surface roughness. The annealed sample shows the transition of hydrophilic to superhydrophilic with the decrease in water contact angles. All of the improved parameters demonstrate that the annealed sample has better switching features than the unannealed samples, which can be a potential candidate for smart tiles, antifogging, and self-cleaning surface applications.
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页数：6
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