Progress in bulk GaN growth

被引:41
|
作者
Xu Ke [1 ,2 ]
Wang Jian-Feng [1 ,2 ]
Ren Guo-Qiang [1 ,2 ]
机构
[1] Chinese Acad Sci, Suzhou Inst Nanotech & Nanobion, Suzhou 215123, Peoples R China
[2] Suzhou Nanowin Sci & Technol Co Ltd, Suzhou 215123, Peoples R China
基金
中国国家自然科学基金; 国家高技术研究发展计划(863计划);
关键词
nitride semiconductor; bulk GaN; hydride vapor phase epitaxy (HVPE); dislocation; VAPOR-PHASE EPITAXY; LIGHT-EMITTING-DIODES; SELECTIVE-AREA GROWTH; AMMONOTHERMAL CRYSTAL-GROWTH; LOW-DISLOCATION-DENSITY; FREESTANDING GAN; SELF-SEPARATION; LATERAL OVERGROWTH; GALLIUM NITRIDE; OPTICAL-PROPERTIES;
D O I
10.1088/1674-1056/24/6/066105
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Three main technologies for bulk GaN growth, i.e., hydride vapor phase epitaxy (HVPE), Na-flux method, and ammonothermal method, are discussed. We report our recent work in HVPE growth of GaN substrate, including dislocation reduction, strain control, separation, and doping of GaN film. The growth mechanisms of GaN by Na-flux and ammonothermal methods are compared with those of HVPE. The mechanical behaviors of dislocation in bulk GaN are investigated through nano-indentation and high-space resolution surface photo-voltage spectroscopy. In the last part, the progress in growing some devices on GaN substrate by homo-epitaxy is introduced.
引用
收藏
页数:16
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