Trapping mechanism and sites of H and D atoms in solid Ne

被引:0
|
作者
Dmitriev, Yu. A. [1 ]
Benetis, N. P. [2 ]
机构
[1] Ioffe Inst, 26 Politekhn Skaya Str, St Petersburg 194021, Russia
[2] Technol Educ Inst Western Macedonia TEI, Dept Environm Engn & Antipollut Control, Kila 50100, Kozani, Greece
关键词
EPR spectra; hydrogen; deuterium; solid Ne; ELECTRON-SPIN-RESONANCE; HYDROGEN-ATOMS; DEUTERIUM ATOMS; MATRIX; EPR; ARGON; RADICALS; KR; PARAMETERS; SPECTRA;
D O I
10.1063/1.5103260
中图分类号
O59 [应用物理学];
学科分类号
摘要
The shifts of the isotropic Fermi contact hyperfine interactions (FCHFI) of hydrogen or deuterium atoms isolated in crystalline noble gases at cryogenic temperatures are compared to the values of the same quantities of the hydrogen atom in the gas phase. New experimental FCHFI values of H/D trapped in crystalline Ne are compared with experimentally obtained and theoretically computed values. The possible trapping sites in the distorted solid Ne gas crystalline structure occupied by the hydrogen atomic impurities are identified by the variation of the FCHFI shifts in the EPR spectra and discussed after their dependence to the deposition method. The present EPR investigation revealed formation of H-2 microcrystals in solid Ne even at a very low H-2 impurity content of 0.01% in the deposited H-2:Ne gaseous mixture.
引用
收藏
页码:663 / 675
页数:13
相关论文
共 50 条
  • [41] Comparison of Six-Dimensional Quantum and Quasi-Classical Dynamics of the Eley-Rideal Reaction of H(D) Atoms with D(H)-Covered Cu(111)
    Xiong, Longlong
    Jiang, Bin
    JOURNAL OF PHYSICAL CHEMISTRY C, 2024, 128 (22) : 9003 - 9010
  • [42] Scattering of H and D Atoms from Epitaxial Graphene at Zero Coverage Limit: An Experimental Benchmark for Theory
    Jiang, Hongyan
    Dorenkamp, Yvonne
    Buenermann, Oliver
    JOURNAL OF PHYSICAL CHEMISTRY C, 2025, 129 (06) : 3003 - 3013
  • [43] Reactions of photogenerated fluorine atoms with molecules trapped in solid argon -: 4.: Spectroscopic characteristics Of β-C2H2F○ radicals generated in reactions of mobile F atoms with C2H2 molecules trapped in solid argon
    Misochko, EY
    Goldschleger, IU
    Akimov, AV
    Wight, CA
    RUSSIAN CHEMICAL BULLETIN, 2001, 50 (06) : 989 - 995
  • [44] Mapping Out Chemically Similar, Crystallographically Nonequivalent Hydrogen Sites in Metal-Organic Frameworks by 1H Solid-State NMR Spectroscopy
    Xu, Jun
    Terskikh, Victor V.
    Chu, Yueying
    Zheng, Anmin
    Huang, Yining
    CHEMISTRY OF MATERIALS, 2015, 27 (09) : 3306 - 3316
  • [45] Synthesis of stable deuterium labelled lignan derivatives and studies of H/D exchange at the aromatic sites
    Pohjoispaa, Monika
    Leppala, Eija
    Wahala, Kristna
    JOURNAL OF LABELLED COMPOUNDS & RADIOPHARMACEUTICALS, 2007, 50 (5-6) : 521 - 522
  • [46] GeH4 adsorption on Si(001) at RT:: transfer of H atoms to Si sites and atomic exchange between Si and Ge
    Murata, T
    Suemitsu, M
    APPLIED SURFACE SCIENCE, 2004, 224 (1-4) : 179 - 182
  • [47] Reactions of photogenerated fluorine atoms with molecules trapped in solid argon. 4. Spectroscopic characteristics of β-C2H2F· radicals generated in reactions of mobile F atoms with C2H2 molecules trapped in solid argon
    E. Ya. Misochko
    I. U. Goldschleger
    A. V. Akimov
    C. A. Wight
    Russian Chemical Bulletin, 2001, 50 : 989 - 995
  • [48] Oxidative Addition of Dihydrogen to Divanadium in Solid Ne: Multiple-Bonded Triplet HVVH and Singlet V2(μ-H)2
    Huebner, Olaf
    Himmel, Hans-Joerg
    ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 2020, 59 (29) : 12206 - 12212
  • [49] Entangled pairs of 2p atoms produced in photodissociation of H2 and D2
    Torizuka, Yutaro
    Hosaka, Kouichi
    Schmidt, Philipp
    Odagiri, Takeshi
    Knie, Andre
    Ehresmann, Arno
    Kougo, Ryoko
    Kitajima, Masashi
    Kouchi, Noriyuki
    PHYSICAL REVIEW A, 2019, 99 (06)
  • [50] H-D Exchange Mechanism of Butene on a D-Absorbed Pd-Au Alloy Surface
    Ogura, Shohei
    Ohno, Satoshi
    Mukai, Kozo
    Yoshinobu, Jun
    Fukutani, Katsuyuki
    JOURNAL OF PHYSICAL CHEMISTRY C, 2019, 123 (13) : 7854 - 7860