First-principles studies of tip-sample interaction and STM-AFM image formation on TiO2(110)-1x1 and TiO2(110)-1x2 surfaces -: art. no. 125417

被引：17
作者：
Ke, SH
Uda, T
Terakura, K
机构：
[1] Angstrom Technol Partnership, Joint Res Ctr Atom Technol, Tsukuba, Ibaraki 3050046, Japan
[2] Natl Inst Adv Ind Sci & Technol, Joint Res Ctr Atom Technol, Tsukuba, Ibaraki 3050046, Japan
[3] AIST, Res Inst Computat Sci, Tsukuba, Ibaraki 3058568, Japan
来源：
PHYSICAL REVIEW B | 2002年 / 65卷 / 12期
关键词：
D O I：
10.1103/PhysRevB.65.125417
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The tip-sample interaction and scanning tunneling microscopy atomic-force microscopy (STM-AFM) image formation on TiO2(110) 1x1 and 1x2 surfaces are simulated by using the ultrasoft pseudopotentials plane-wave technique. The effects of spin polarization and bias voltage on the tip-sample interaction in AFM are also investigated. The calculation demonstrates that overall the tip-oxygen interaction is much stronger than the tip-Ti interaction, which determines the main feature of the AFM image formation. The present calculations provide reasonable explanations to a very recent experiment adopting the technique of the combination of STM and AFM.
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页码：1 / 7
页数：7
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