Why some interfaces cannot be sharp

被引:1356
作者
Nakagawa, N
Hwang, HY
Muller, DA [1 ]
机构
[1] Cornell Univ, Sch Appl & Engn Phys, Ithaca, NY 14583 USA
[2] Japan Sci & Technol Agcy, Kawaguchi 3320012, Japan
[3] Univ Tokyo, Dept Adv Mat Sci, Chiba 2778561, Japan
基金
美国国家科学基金会;
关键词
D O I
10.1038/nmat1569
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A central goal of modern materials physics and nanoscience is the control of materials and their interfaces to atomic dimensions. For interfaces between polar and nonpolar layers, this goal is thwarted by a polar catastrophe that forces an interfacial reconstruction. In traditional semiconductors, this reconstruction is achieved by an atomic disordering and stoichiometry change at the interface, but a new option is available in multivalent oxides: if the electrons can move, the atoms do not have to. Using atomic-scale electron energy loss spectroscopy, we have examined the microscopic distribution of charge and ions across the (001) LaAlO3/SrTiO3 interface. We find that there is a fundamental asymmetry between the ionically compensated AlO2/SrO/TiO2 interface, and the electronically compensated AlO2/ LaO/TiO2 interface, both in interfacial sharpness and charge density. This suggests a general strategy to design sharp interfaces, remove interfacial screening charges, control the band offset and, hence, markedly improve the performance of oxide devices.
引用
收藏
页码:204 / 209
页数:6
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