Positron trapping in plastically deformed Cd

被引：0

作者：

Sen Gupta, A ^{[1
]}

机构：

[1] Visva Bharati Cent Univ, Dept Phys, Santini Ketan 731235, W Bengal, India

来源：

SOLID STATE COMMUNICATIONS | 2002年 / 122卷 / 1-2期

关键词：

positron lifetime and annihilation lineshape; plastic deformation of cadmium;

D O I：

10.1016/S0038-1098(02)00085-6

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Positron measurements, both lifetime and annihilation lineshape, have been performed in Cd, plastically deformed at room temperature by 40 and 60% thickness reductions. Less change in lineshape parameter for 60% deformation is observed. The annealing of 40% deformed sample between 25 and 200 T indicates the breaking up of dislocation network during recrystallisation process. (C) 2002 Elsevier Science Ltd. All rights reserved.

引用

页码：79 / 82

页数：4

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