Absorption Modulation of Plasmon Resonant Nanoparticles in the Presence of an AFM Tip

被引:4
作者
Huda, Gazi M. [1 ]
Hastings, J. Todd [1 ]
机构
[1] Univ Kentucky, Dept Elect & Comp Engn, Lexington, KY 40506 USA
基金
美国国家科学基金会;
关键词
Absorption; atomic force microscopy; finite element methods; nanoparticles; GOLD NANOPARTICLES; FIELD; SURFACE; ENHANCEMENT; PROBE;
D O I
10.1109/JSTQE.2013.2244562
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We numerically calculated the optical absorption cross section (C-abs) of a silver nanoparticle (AgNP) and a gold nanoparticle (AuNP) in the presence of metallic (gold) and dielectric (silicon) atomic force microscope (AFM) probes, illuminated by transverse magnetic polarized, total internally reflected waves. Both nanoscale probes localize and enhance the field between the apex of the tip and the particle. However, the absorption of the nanoparticle is not always enhanced. Fitting the numerical absorption data to a driven damped harmonic oscillator model revealed that the AFM tip modifies both the driving force (F-0), consisting of the free carrier charge and the driving field, and the overall damping of the oscillator (beta). These effects can be complementary or competing, and they combine to either enhance or suppress absorption. Therefore, under an Si tip, C-abs of a AuNP is enhanced while C-abs of a AgNP is suppressed. In contrast, an Au tip suppresses the absorption cross section for both Au and Ag NPs.
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页数:6
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