Transmission electron microscopy of native copper inclusions in illite

被引：18
作者：
Ahn, JH
Xu, HF
Buseck, PR
机构：
[1] ARIZONA STATE UNIV,DEPT GEOL,TEMPE,AZ 85287
[2] ARIZONA STATE UNIV,DEPT CHEM BIOCHEM,TEMPE,AZ 85287
来源：
CLAYS AND CLAY MINERALS | 1997年 / 45卷 / 02期
关键词：
copper inclusions; illite; native copper; transmission electron microscopy (TEM); weathering;
D O I：
10.1346/CCMN.1997.0450218
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
[No abstract available]
引用
收藏
页码：295 / 297
页数：3
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