Electric current-induced stresses at the crack tip in conductors

The electromagnetic and thermal effects on the stress distribution around the crack tip in conducting materials due to electric current are investigated. Emphases are placed on quantifying the crack growth behavior affected by the interplay between these effects. A two-dimensional finite element analysis is conducted to examine the coupled problems. The results show that the compressive stress state around the crack tip plays a decisive role in preventing the crack from further growth. The resulting normal stress in front of the crack tip caused by the Joule heat generation tends to suppress the crack growth, while the stress induced by the electromagnetic forces provides a tensile normal stress with smaller magnitude in the vicinity of the crack tip, hence promotes the crack growth. Favorable agreements between numerical analysis results and existing experimental results are achieved. By utilizing these phenomena, the electric current may be used to actively control the damage propagation, hence catastrophic failure can be prevented.