Compliance measurements of confined polystyrene solutions by atomic force microscopy

被引：75
作者：
Overney, RM
Leta, DP
Pictroski, CF
Rafailovich, MH
Liu, Y
Quinn, J
Sokolov, J
Eisenberg, A
Overney, G
机构：
[1] SUNY STONY BROOK,DEPT MAT SCI,STONY BROOK,NY 11794
[2] MCGILL UNIV,DEPT CHEM,MONTREAL,PQ H3A 2K6,CANADA
[3] UNIV NEW MEXICO,DEPT CHEM,ALBUQUERQUE,NM 87131
来源：
PHYSICAL REVIEW LETTERS | 1996年 / 76卷 / 08期
关键词：
D O I：
10.1103/PhysRevLett.76.1272
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The use of the atomic force microscope (AFM) as a local probe for elastohydrodynamic lubrication is discussed. Compliances are measured with a modified AFM that allows application of ac and de force-displacement curves on end-grafted poly(styrene) chains in good (toluene) and poor (water) solvents. In toluene, the chains form a stretched brush whose elastic modulus is an order of magnitude larger than that of the collapsed layer in water. The de force-displacement curves are compared to those previously obtained on similar systems with the surface forces apparatus.
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收藏
页码：1272 / 1275
页数：4
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