Large piezoresponse of Na0.5Bi0.5TiO3-K0.5Bi0.5TiO3 thin films prepared via water-based sol-gel method

被引：12

作者：

Cui Wenha ^{[1
]}

Wang Xiaohui ^{[1
]}

Li Longtu ^{[1
]}

机构：

[1] Tsinghua Univ, Sch Mat Sci & Engn, State Key Lab New Ceram & Fine Proc, Beijing 100084, Peoples R China

来源：

CERAMICS INTERNATIONAL | 2015年 / 41卷

基金：

中国国家自然科学基金;

关键词：

A; Films; A. Sol gel processes; C. Electrical properties; C. Piezoelectric properties; D; Perovskites; MORPHOTROPIC PHASE-BOUNDARY; PULSED-LASER DEPOSITION; PIEZOELECTRIC PROPERTIES; FERROELECTRIC PROPERTIES; DIELECTRIC-PROPERTIES;

D O I：

10.1016/j.ceramint.2015.03.232

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

(Na0.85K0.15)(0.5)Bi0.5TiO3 (abbreviated as NKBT) thin films were fabricated via an economical aqueous sol-gel method on Pt(1 1 1)/Ti/SiO2/Si substrates. Overdoping of volatile cations in the precursor solutions was necessary to achieve pure perovskite structure due to compensation of cations loss that occurred during heat treatment. Different annealing temperature was investigated to get the films with single perovskite phase detected by XRD patterns. Thin films of 250 nm thickness exhibited a dielectric constant and a loss tangent at 100 kHz of 519 and 0.058, respectively. A high effective piezoelectric coefficient (d(33)) of approximately 76 pm/V was obtained via PFM. (C) 2015 Elsevier Ltd and Techna Group S.r.l. All rights reserved.

引用

页码：S37 / S40

页数：4

共 17 条

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