Growth and optical properties of gallium nitride film on glass substrates

被引:5
|
作者
An, Pingbo [1 ]
Zhao, Lixia [1 ]
Zhang, Shuo [1 ]
Liu, Lei [1 ]
Duan, Ruifei [1 ]
Wei, Xuecheng [1 ]
Lu, Hongxi [1 ]
Wang, Junxi [1 ]
Li, Jinmin [1 ]
机构
[1] Chinese Acad Sci, Inst Semicond, Semicond Lighting Res & Dev Ctr, Tsinghua East Rd A35, Beijing 100083, Peoples R China
基金
中国国家自然科学基金;
关键词
gallium nitride; quartz glass; MOCVD; temperature-dependent photoluminescence; LOW-TEMPERATURE GROWTH; ECR-PEMOCVD; GAN FILMS; DEPENDENCE;
D O I
10.1002/pssc.201510207
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this study, gallium nitride (GaN) films were grown on the quartz glass substrates using metal organic chemical vapor deposition with AlN buffer layer. The AlN layer was deposited using rf-magnetron sputtering. Although the direct nucleation of GaN on quartz glass substrate is difficult, with AlN as the nucleation layer, a large-area polycrystalline GaN film can be obtained. The structural and optical properties were investigated. The results show that the GaN film has a preferential orientation along (0002). There are mainly three emission regions in the photoluminescence spectra, including the band-edge, green (2.45-2.55eV) and yellow (2.0-2.35 eV) emission regions. The origin and temperature dependence of the peak position, full-width of half-magnitude and intensity were also discussed. The findings may help to understand the growth and improve the properties of GaN film grown on amorphous glass substrates. (C) 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:200 / 204
页数:5
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