Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy

被引：12
作者：
Martinez, G. T. [1 ]
van den Bos, K. H. W. [1 ]
Alania, M. [1 ]
Nellist, P. D. [2 ]
Van Aert, S. [1 ]
机构：
[1] Univ Antwerp, Electron Microscopy Mat Sci EMAT, Gronenborgerlaan 171, B-2020 Antwerp, Belgium
[2] Univ Oxford, Dept Mat, Parks Rd, Oxford OX1 3PH, England
来源：
ULTRAMICROSCOPY | 2018年 / 187卷
关键词：
ADF STEM; Electron scattering; Quantitative STEM; Image simulation; LATTICE-RESOLUTION CONTRAST; OPTIMAL EXPERIMENTAL-DESIGN; THERMAL DIFFUSE-SCATTERING; STEM; ATOMS; PROBE; SIMULATION; CATALYST; DETECTOR; IMAGES;
D O I：
10.1016/j.ultramic.2018.01.005
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
In quantitative scanning transmission electron microscopy (STEM), scattering cross-sections have been shown to be very sensitive to the number of atoms in a column and its composition. They correspond to the integrated intensity over the atomic column and they outperform other measures. As compared to atomic column peak intensities, which saturate at a given thickness, scattering cross-sections increase monotonically. A study of the electron wave propagation is presented to explain the sensitivity of the scattering cross-sections. Based on the multislice algorithm, we analyse the wave propagation inside the crystal and its link to the scattered signal for the different probe positions contained in the scattering cross-section for detector collection in the low-, middle- and high-angle regimes. The influence to the signal from scattering of neighbouring columns is also discussed. (C) 2018 Elsevier B.V. All rights reserved.
引用
收藏
页码：84 / 92
页数：9
相关论文
共 56 条
  • [1] Lattice-resolution contrast from a focused coherent electron probe. Part I
    Allen, LJ
    Findlay, SD
    Oxley, MP
    Rossouw, CJ
    [J]. ULTRAMICROSCOPY, 2003, 96 (01) : 47 - 63
  • [2] Three-Dimensional Atomic Imaging of Colloidal Core-Shell Nanocrystals
    Bals, Sara
    Casavola, Marianna
    van Huis, Marijn A.
    Van Aert, Sandra
    Batenburg, K. Joost
    Van Tendeloo, Gustaaf
    Vanmaekelbergh, Daniel
    [J]. NANO LETTERS, 2011, 11 (08) : 3420 - 3424
  • [3] Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope
    Behan, G.
    Cosgriff, E. C.
    Kirkland, Angus I.
    Nellist, Peter D.
    [J]. PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2009, 367 (1903): : 3825 - 3844
  • [4] The quantum mechanics of the impact process
    Born, M
    [J]. ZEITSCHRIFT FUR PHYSIK, 1926, 37 (12): : 863 - 867
  • [5] THE SCATTERING OF ELECTRONS BY ATOMS AND CRYSTALS .1. A NEW THEORETICAL APPROACH
    COWLEY, JM
    MOODIE, AF
    [J]. ACTA CRYSTALLOGRAPHICA, 1957, 10 (10): : 609 - 619
  • [6] Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities
    De Backer, A.
    Jones, L.
    Lobato, I.
    Altantzis, T.
    Goris, B.
    Nellist, P. D.
    Bals, S.
    Van Aert, S.
    [J]. NANOSCALE, 2017, 9 (25) : 8791 - 8798
  • [7] Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting
    De Backer, A.
    Martinez, G. T.
    MacArthur, K. E.
    Jones, L.
    Beche, A.
    Nellist, P. D.
    Van Aert, S.
    [J]. ULTRAMICROSCOPY, 2015, 151 : 56 - 61
  • [8] Optimal experimental design for nano-particle atom-counting from high-resolution STEM images
    De Backer, A.
    De Wael, A.
    Gonnissen, J.
    Van Aert, S.
    [J]. ULTRAMICROSCOPY, 2015, 151 : 46 - 55
  • [9] Atom counting in HAADF STEM using a statistical model-based approach: Methodology, possibilities, and inherent limitations
    De Backer, A.
    Martinez, G. T.
    Rosenauer, A.
    Van Aert, S.
    [J]. ULTRAMICROSCOPY, 2013, 134 : 23 - 33
  • [10] Hybrid statistics-simulations based method for atom-counting from ADF STEM images
    De Wael, Annelies
    De Backer, Annick
    Jones, Lewys
    Nellist, Peter D.
    Van Aert, Sandra
    [J]. ULTRAMICROSCOPY, 2017, 177 : 69 - 77
123456