Comparison of intensity and absolute contrast of simulated and experimental high-resolution transmission electron microscopy images for different multislice simulation methods

被引:21
作者
Krause, Florian F. [1 ]
Mueller, Knut [1 ]
Zillmann, Dennis [1 ]
Jansen, Jacob [2 ]
Schowalter, Marco [1 ]
Rosenauer, Andreas [1 ]
机构
[1] Univ Bremen, Inst Festkorperphys, D-28359 Bremen, Germany
[2] Delft Univ Technol, Natl Ctr HREM, Kavli Inst Nanosci, NL-2628 CJ Delft, Netherlands
关键词
Stobbs factor; HRTEM; MTF; Frozen lattice simulation; Incoherent summation; THERMAL DIFFUSE-SCATTERING; DIFFRACTION; ACCURATE; TEM;
D O I
10.1016/j.ultramic.2013.05.015
中图分类号
TH742 [显微镜];
学科分类号
摘要
The Stobbs factor problem, a major difference of absolute contrast between experimental and simulated high resolution transmission electron microscopy images has been reported frequently. In this respect, some modifications to the multislice simulation techniques were proposed to improve the correspondence to the experiment. The influence of different suggestions on the simulated contrast is investigated by numerical simulations. The agreement between experiment and simulations is then checked by comparison with high-resolution micrographs of crystalline gold. The experimental data is therefore compared to simulated intensities computed for the thickness and orientation of the specimen measured by refinements of diffraction patterns. The agreement of both intensity and contrast is investigated and the remaining contrast discrepancy is determined. The results show a good agreement for a small objective aperture, while for a larger aperture a difference of contrast by a factor of 1.2 can still be observed. Without any aperture, the deviation between experiment and simulations is largest. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:94 / 101
页数:8
相关论文
共 24 条
[1]   Exit wave reconstruction at atomic resolution [J].
Allen, LJ ;
McBride, W ;
O'Leary, NL ;
Oxley, MP .
ULTRAMICROSCOPY, 2004, 100 (1-2) :91-104
[2]   Quantification of high-resolution electron microscope images of amorphous carbon [J].
Boothroyd, CB .
ULTRAMICROSCOPY, 2000, 83 (3-4) :159-168
[3]   Why don't high-resolution simulations and images match? [J].
Boothroyd, CB .
JOURNAL OF MICROSCOPY, 1998, 190 :99-108
[4]   MEASURING THE HEIGHT OF STEPS ON MGO CUBES USING FRESNEL CONTRAST IN A SCANNING-TRANSMISSION ELECTRON-MICROSCOPE [J].
BOOTHROYD, CB ;
HUMPHREYS, CJ .
ULTRAMICROSCOPY, 1993, 52 (3-4) :318-324
[5]   Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs [J].
Du, K. ;
von Hochmeister, K. ;
Phillipp, F. .
ULTRAMICROSCOPY, 2007, 107 (4-5) :281-292
[6]   Thermal diffuse scattering in transmission electron microscopy [J].
Forbes, B. D. ;
D'Alfonso, A. J. ;
Findlay, S. D. ;
Van Dyck, D. ;
LeBeau, J. M. ;
Stemmer, S. ;
Allen, L. J. .
ULTRAMICROSCOPY, 2011, 111 (12) :1670-1680
[7]   Hunting the Stobbs factor [J].
Howie, A .
ULTRAMICROSCOPY, 2004, 98 (2-4) :73-79
[8]   QUANTITATIVE COMPARISON OF HIGH-RESOLUTION TEM IMAGES WITH IMAGE SIMULATIONS [J].
HYTCH, MJ ;
STOBBS, WM .
ULTRAMICROSCOPY, 1994, 53 (03) :191-203
[9]   CONTRAST TRANSFER OF CRYSTAL IMAGES IN TEM [J].
ISHIZUKA, K .
ULTRAMICROSCOPY, 1980, 5 (01) :55-65
[10]   MSLS, a least-squares procedure for accurate crystal structure refinement from dynamical electron diffraction patterns [J].
Jansen, J ;
Tang, D ;
Zandbergen, HW ;
Schenk, H .
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 1998, 54 :91-101