Use of Code Error and Beat Frequency Test Method to Identify Single Event Upset Sensitive Circuits in a 1 GHz Analog to Digital Converter

被引：6

作者：

Kruckmeyer, Kirby ^{[1
]}

Rennie, Robert L. ^{[1
]}

Ramachandran, Vishwanath ^{[2
]}

机构：

[1] Natl Semicond Corp, Santa Clara, CA 95052 USA

[2] Vanderbilt Univ, Nashville, TN 37235 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2008年 / 55卷 / 04期

关键词：

Analog-digital conversion; beat frequency; code error; single event upset;

D O I：

10.1109/TNS.2008.921940

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Typical test methods for characterizing the single event upset performance of an analog to digital converter (ADC) have involved holding the input at static values. As a result, output error signatures are seen for only a few input voltage and output codes. A test method using an input beat frequency and output code error detection allows an ADC to be characterized with a dynamic input at a high frequency. With this method, the impact of an ion strike can be seen over the full code range of the output. The error signatures from this testing can provide clues to which area of the ADC is sensitive to an ion strike.

引用

页码：2013 / 2018

页数：6

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