ECT Simulation of Complex Narrow Cracks in Planar Multi-Layered Structures

被引：0

作者：

Miorelli, Roberto ^{[1
]}

Reboud, Christophe ^{[1
]}

Lesselier, Dominique ^{[2
]}

Poulakis, Nikolaos ^{[3
]}

Theodoulidis, Theodoros ^{[4
]}

机构：

[1] Ctr Etud Saclay, CEA LIST, F-91191 Gif Sur Yvette, France

[2] Univ Paris, CNRS, Lab Signaux & Systemes, Dept Rech Elect,UMR 8506,SUPELEC, Paris, France

[3] Technol Educ Inst Western, Dept Elect Engn, Macedonia, Greece

[4] Univ Western Macedonia, Dept Mech Engn, Macedonia, Greece

来源：

ELECTROMAGNETIC NONDESTRUCTIVE EVALUATION (XVI) | 2014年 / 38卷

关键词：

Eddy current testing; narrow cracks; semi-analytical modeling; boundary element method; dyadic Green function; layered medium;

D O I：

10.3233/978-1-61499-354-4-103

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A fast simulation tool of Eddy Current Testing (ECT) inspections, based on a Boundary Element Method (BEM), is proposed in this paper. Simulated signals consist of impedance variation of a coil due to multiple narrow cracks located in conductive planar multilayered structures (MLS). The cracks can have various shapes or orientations and can lie in any layer of the structure inspected. After a presentation of the method, validations results, consisting of comparison of simulated signals with experimental data and results obtained with finite element calculations, are presented. In all the problems tested, a very good accuracy and a very low computation time have been observed. Further perspective and conclusions of this work are detailed at the end of the paper.

引用

页码：103 / +

页数：2

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