Dynamics of laser-induced damage of spherical nanoparticles by high-intensity ultrashort laser pulses

被引:3
作者
Komolov, Vladimir L. [1 ]
Gruzdev, Vitaly E. [2 ]
Przhibelskii, Sergey G. [1 ]
Smirnov, Dmitry S. [3 ]
机构
[1] St Petersburg Natl Res Univ Informat Technol Mech, Ctr Opt Informat Technol, St Petersburg, Russia
[2] Univ Missouri, Dept Mech & Aerosp Engn, Columbia, MO 65211 USA
[3] New Informat Technol Aviat NITA LLC, St Petersburg, Russia
关键词
laser damage; ultrashort laser pulses; nanoparticles; ionization; contamination; SIMPLE METAL-CLUSTERS; THIN INSULATING FILM; IONIZATION-POTENTIALS; ELECTRONIC-PROPERTIES; COULOMB EXPLOSION; JELLIUM MODEL; ABLATION; BREAKDOWN; PHYSICS; DIELECTRICS;
D O I
10.1117/1.OE.51.12.121816
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Damage of a metal spherical nanoparticle by femtosecond laser pulses is analyzed by splitting the overall process into two steps. The fast step includes electron photoemission from a nanoparticle. It takes place during direct action of a laser pulse and its rate is evaluated as a function of laser and particle parameters by two approaches. Obtained results suggest the formation of significant positive charge of the nanoparticles due to the photoemission. The next step includes ion emission that removes the excessive positive charge and modifies particle structure. It is delayed with respect to the photo-emission and is analyzed by a simple analytical model and modified molecular dynamics. Obtained energy distribution suggests generation of fast ions capable of penetrating into surrounding material and generating defects next to the nanoparticle. The modeling is extended to the case of a nanoparticle on a solid surface to understand the basic mechanism of surface laser damage initiated by nano-contamination. Simulations predict embedding the emitted ions into substrate within a spot with size significantly exceeding the original particle size. We discuss the relation of those effects to the problem of bulk and surface laser-induced damage of optical materials by single and multiple ultrashort laser pulses. (C) 2012 Society of Photo-Optical Instrumentation Engineers (SPIE). [DOI: 10.1117/1.OE.51.12.121816]
引用
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页数:11
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