Temperature dependent exchange bias effect in polycrystalline BiFeO3/FM (FM = NiFe, Co) bilayers

被引:19
|
作者
Xue, Xiaobo [1 ,2 ]
Yuan, Xueyong [3 ]
Rui, Wenbin [1 ,2 ]
Xu, Qingyu [3 ]
You, Biao [1 ,2 ]
Zhang, Wei [1 ,2 ]
Zhou, Shiming [4 ]
Du, Jun [1 ,2 ]
机构
[1] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Jiangsu, Peoples R China
[2] Nanjing Univ, Dept Phys, Nanjing 210093, Jiangsu, Peoples R China
[3] Southeast Univ, Dept Phys, Nanjing 211189, Jiangsu, Peoples R China
[4] Tongji Univ, Dept Phys, Shanghai 200092, Peoples R China
来源
EUROPEAN PHYSICAL JOURNAL B | 2013年 / 86卷 / 04期
基金
美国国家科学基金会;
关键词
Solid State and Materials;
D O I
10.1140/epjb/e2013-31003-y
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Extensive studies on the temperature (T) dependent exchange bias effect were carried out in polycrystalline BiFeO3(BFO)/NiFe and BFO/Co bilayers. In contrast to single-crystalline BFO/ferromagnet (FM) bilayers, sharp increase of the exchange bias field (H-E) below 50 K were clearly observed in both of these two bilayers. However, when T is higher than 50 K, H-E increases with T and decreases further when T is larger than 230 K (for BFO/NiFe) or 200 K (for BFO/Co), which is similar to those reported in single-crystalline BFO/FM bilayers. After the exploration of magnetic field cooling, the temperature dependent exchange bias can be explained considering two contributions from both the interfacial spin-glass-like frustrated spins and the polycrystalline grains in the BFO layer. Moreover, obvious exchange bias training effect can be observed at both 5 K and room temperature and the corresponding results can be well fitted based on a recently proposed theoretical model taking into account the energy dissipation of the AFM layer.
引用
收藏
页数:6
相关论文
共 50 条
  • [1] Temperature dependent exchange bias effect in polycrystalline BiFeO3/FM (FM  =  NiFe, Co) bilayers
    Xiaobo Xue
    Xueyong Yuan
    Wenbin Rui
    Qingyu Xu
    Biao You
    Wei Zhang
    Shiming Zhou
    Jun Du
    The European Physical Journal B, 2013, 86
  • [2] BiFeO3 thickness dependence of the exchange bias in polycrystalline BiFeO3/NiFe bilayers
    Xiaobo Xue
    Biao You
    Jie Pan
    Wenbing Rui
    Wei Zhang
    Liang Sun
    Jun Du
    Xueyong Yuan
    Qingyu Xu
    Journal of the Korean Physical Society, 2013, 62 : 1950 - 1953
  • [3] BiFeO3 thickness dependence of the exchange bias in polycrystalline BiFeO3/NiFe bilayers
    Xue, Xiaobo
    You, Biao
    Pan, Jie
    Rui, Wenbing
    Zhang, Wei
    Sun, Liang
    Du, Jun
    Yuan, Xueyong
    Xu, Qingyu
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2013, 62 (12) : 1950 - 1953
  • [4] Exchange bias in sputtered FM/BiFeO3 thin films (FM = Fe and Co)
    Chang, H. W.
    Yuan, F. T.
    Shih, C. W.
    Li, W. L.
    Chen, P. H.
    Wang, C. R.
    Chang, W. C.
    Jen, S. U.
    JOURNAL OF APPLIED PHYSICS, 2012, 111 (07)
  • [5] Controlling the exchange bias in multiferroic BiFeO3 and NiFe bilayers
    Dho, Joonghoe
    Blamire, M.G.
    Journal of Applied Physics, 2009, 106 (07):
  • [6] Controlling the exchange bias in multiferroic BiFeO3 and NiFe bilayers
    Dho, Joonghoe
    Blamire, M. G.
    JOURNAL OF APPLIED PHYSICS, 2009, 106 (07)
  • [7] Temperature dependent exchange bias training effect in single-crystalline BiFeO3/Co bilayers
    He, M. C.
    You, B.
    Tu, H. Q.
    Sheng, Y.
    Xu, Q. Y.
    Rui, W. B.
    Gao, Y.
    Zhang, Y. Q.
    Xu, Y. B.
    Du, J.
    JOURNAL OF APPLIED PHYSICS, 2015, 117 (17)
  • [8] Temperature dependence of exchange bias in NiFe2O4/BiFeO3 bilayers
    Wang, Ji
    Chen, Chen
    Xu, Biao
    Xu, Qingyu
    Liu, Ruobai
    Yuan, Yuan
    Huang, Linao
    Liu, Tianyu
    Wei, Lujun
    You, Biao
    Zhang, Wei
    Du, Jun
    APPLIED SURFACE SCIENCE, 2020, 517
  • [9] Room Temperature Exchange Bias in BiFeO3/Co-Fe Bilayers
    Sterwerf, Christian
    Meinert, Markus
    Arenholz, Elke
    Schmalhorst, Jan-Michael
    Reiss, Guenter
    IEEE TRANSACTIONS ON MAGNETICS, 2016, 52 (07)
  • [10] Annealing temperature dependence of exchange bias in BiFeO3/CoFe bilayers
    Yu, T.
    Naganuma, H.
    Wang, W. X.
    Ando, Y.
    Han, X. F.
    JOURNAL OF APPLIED PHYSICS, 2012, 111 (07)