Microstructural variations in Cu/Nb and Al/Nb nanometallic multilayers

被引:6
作者
Polyakov, M. N. [1 ]
Courtois-Manara, E. [2 ,3 ]
Wang, D. [2 ,3 ]
Chakravadhanula, K. [2 ,3 ,4 ]
Kuebel, C. [2 ,3 ]
Hodge, A. M. [1 ]
机构
[1] Univ So Calif, Dept Aerosp & Mech Engn, Los Angeles, CA 90089 USA
[2] Karlsruhe Inst Technol, Inst Nanotechnol, D-76021 Karlsruhe, Germany
[3] Karlsruhe Inst Technol, Karlsruhe NanoMicro Facil, D-76021 Karlsruhe, Germany
[4] Helmholtz Inst Ulm, D-76344 Eggenstein Leopoldshafen, Germany
关键词
SCALE-DEPENDENT DEFORMATION; NANOLAYERED COMPOSITES; MECHANICAL-PROPERTIES; NANOSTRUCTURED MULTILAYERS; EPITAXIAL-GROWTH; CU; PHASE; NB; ORIENTATION; DEPOSITION;
D O I
10.1063/1.4811822
中图分类号
O59 [应用物理学];
学科分类号
摘要
Miscible (Al/Nb) and immiscible (Cu/Nb) nanometallic multilayer systems were characterized by means of transmission electron microscopy techniques, primarily by automated crystallographic orientation mapping, which allows for the resolution of crystal structures and orientations at the nanoscale. By using this technique, distinctive Nb orientations in relation to the crystallographic state of the Al and Cu layer structures can be observed. Specifically, the Al and Cu layers were found to consist of amorphous, semi-amorphous, and crystalline regions, which affect the overall multilayer microstructure. (C) 2013 AIP Publishing LLC.
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页数:4
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共 29 条
  • [1] MICROSTRUCTURAL TRANSITIONS IN TITANIUM-ALUMINUM THIN-FILM MULTILAYERS
    AHUJA, R
    FRASER, HL
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1994, 23 (10) : 1027 - 1034
  • [2] Optimum deposition condition of Nb/Al multilayers for large-scale array detectors with superconducting tunnel junctions
    Chen, Y.
    Ukibe, M.
    Kurokawa, A.
    Fujimoto, T.
    Ohkubo, M.
    [J]. PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2008, 468 (15-20): : 2004 - 2008
  • [3] STRUCTURAL AND ELECTRONIC TRENDS IN THE GROWTH OF CU OVERLAYERS ON THE NB(110) SURFACE
    ELBATANOUNY, M
    STRONGIN, M
    [J]. PHYSICAL REVIEW B, 1985, 31 (08): : 4798 - 4801
  • [4] Mechanical properties of sputtered Cu/V and Al/Nb multilayer films
    Fu, E. G.
    Li, Nan
    Misra, A.
    Hoagland, R. G.
    Wang, H.
    Zhang, X.
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2008, 493 (1-2): : 283 - 287
  • [5] ATTEMPT TO DESIGN A STRONG SOLID
    KOEHLER, JS
    [J]. PHYSICAL REVIEW B, 1970, 2 (02): : 547 - &
  • [6] Observation of body centered cubic Cu in Cu/Nb nanolayered composites
    Kung, H
    Lu, YC
    Griffin, AJ
    Nastasi, M
    Mitchell, TE
    Embury, JD
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (15) : 2103 - 2105
  • [7] ELECTRONIC-PROPERTIES OF BODY-CENTERED-TETRAGONAL COPPER
    LI, H
    WU, SC
    QUINN, J
    LI, YS
    TIAN, D
    JONA, F
    [J]. JOURNAL OF PHYSICS-CONDENSED MATTER, 1991, 3 (37) : 7193 - 7198
  • [8] Deformation mechanisms and strength in nanoscale multilayer metallic composites with coherent and incoherent interfaces
    Mastorakos, Ioannis N.
    Zbib, Hussein M.
    Bahr, David F.
    [J]. APPLIED PHYSICS LETTERS, 2009, 94 (17)
  • [9] The radiation damage tolerance of ultra-high strength nanolayered composites
    Misra, A.
    Demkowicz, M. J.
    Zhang, X.
    Hoagland, R. G.
    [J]. JOM, 2007, 59 (09) : 62 - 65
  • [10] Plastic flow stability of metallic nanolaminate composites
    Misra, A.
    Hoagland, R. G.
    [J]. JOURNAL OF MATERIALS SCIENCE, 2007, 42 (05) : 1765 - 1771