Microstructures and dielectric properties of (Na0.5Bi0.5)0.775Ba0.225Ti0.775Sn0.225O3 relaxor ferroelectric with Bi2O3-B2O3-ZnO glass addition

To further manipulate the dielectric properties of (Na0.5Bi0.5)(0.775)Ba0.225Ti0.775Sn0.225O3 ceramics, (Na0.5Bi0.5)(0.775)Ba0.225Ti0.775Sn0.225O3-x wt% Bi2O3-B2O3-ZnO (BBZ) ceramics were prepared via a conventional solid state reaction method, whilst the effect of BBZ glass content on dielectric and ferroelectric properties was investigated. In XRD patterns, the minimal secondary phase of Zn-3(BO3)(2) can be detected in these compounds when x>5. With the addition of BBZ glass, diffuse phase transition behavior (DPT) and the high temperature stability of permittivity were enhanced. When x=7, a high permittivity of 1600 +/- 15%, from50 to475 degrees C was obtained. Additionally, a high W-d of 1.4J/cm(3) and ? of 75.5% (measured at 150kV/cm) were achieved due to the enhanced P-m of 24C/cm(2). This work demonstrated that the study on (Na0.5Bi0.5)(0.775)Ba0.225Ti0.775Sn0.225O3 ceramics with BBZ glass addition providing an adequate strategy to enhance P-m.