Use of quantitative convergent-beam electron diffraction in materials science

被引：0
作者：
Holmestad, R [1 ]
Birkeland, CR
Marthinsen, K
Hoier, R
Zu, JM
机构：
[1] Norwegian Univ Sci & Technol, Dept Phys, N-7491 Trondheim, Norway
[2] Norwegian Univ Sci & Technol, Dept Mat Technol & Electrochem, N-7491 Trondheim, Norway
来源：
MICROSCOPY RESEARCH AND TECHNIQUE | 1999年 / 46卷 / 02期
关键词：
convergent-beam electron diffraction; energy filtering; thickness; lattice parameter; charge density; bonding; TiAl; non-centrosymmetric; phase determination; polarity;
D O I：
10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O
中图分类号：
R602 [外科病理学、解剖学]; R32 [人体形态学];
学科分类号：
100101 ;
摘要：
Methods for quantitative convergent-beam electron diffraction are outlined and some results of our applications of convergent-beam electron diffraction are shown, with emphasis on quantitative analysis of crystal structures in materials science. Examples of thickness measurements and determination of lattice parameters are presented. Measurements of low-order structure factors to obtain information on bonding charge-density distributions are reviewed, with examples from TiAl intermetallics. For non-centrosymmetric crystals, a method to determine three-phase structure invariants is given. Determination of polarity is also discussed. Microsc. Res. Tech. 46:130-145, 1999. (C) 1999 Wiley-Liss, Inc.
引用
收藏
页码：130 / 145
页数：16
相关论文
共 90 条
  • [11] FULL-POTENTIAL, LINEARIZED AUGMENTED PLANE-WAVE PROGRAMS FOR CRYSTALLINE SYSTEMS
    BLAHA, P
    SCHWARZ, K
    SORANTIN, P
    TRICKEY, SB
    [J]. COMPUTER PHYSICS COMMUNICATIONS, 1990, 59 (02) : 399 - 415
  • [12] BLAKE RG, 1978, PHILOS MAG A, V37, P1, DOI 10.1080/01418617808239158
  • [13] Volume fraction measurement of dispersoids in a thin foil by parallel energy-loss spectroscopy: Development and assessment of the technique
    Botton, GA
    LEsperance, G
    Gallerneault, CE
    Ball, MD
    [J]. JOURNAL OF MICROSCOPY-OXFORD, 1995, 180 : 217 - 229
  • [14] BENEFITS OF ENERGY-FILTERING FOR ADVANCED CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS
    BURGESS, WG
    PRESTON, AR
    BOTTON, GA
    ZALUZEC, NJ
    HUMPHREYS, CJ
    [J]. ULTRAMICROSCOPY, 1994, 55 (03) : 276 - 283
  • [15] BURGESS WG, 1993, MICROBEAM ANAL, V2, P222
  • [16] 3-DIMENSIONAL STRAIN-FIELD INFORMATION IN CONVERGENT-BEAM ELECTRON-DIFFRACTION PATTERNS
    CARPENTER, RW
    SPENCE, JCH
    [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1982, 38 (JAN): : 55 - &
  • [17] Low-order structure-factor amplitude and sign determination of an unknown structure AlmFe by quantitative convergent-beam electron diffraction
    Cheng, YF
    Nuchter, W
    Mayer, J
    Weickenmeier, A
    Gjonnes, J
    [J]. ACTA CRYSTALLOGRAPHICA SECTION A, 1996, 52 : 923 - 936
  • [18] CHERNS D, 1989, J ELECT MICROSC TECH, V13, P77
  • [19] RELATIVISTIC HARTREE-FOCK X-RAY AND ELECTRON SCATTERING FACTORS
    DOYLE, PA
    TURNER, PS
    [J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1968, A 24 : 390 - &
  • [20] CONVERGENT-BEAM DIFFRACTION .1. INTRODUCTION
    EADES, JA
    [J]. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1989, 13 (01): : 1 - 2
123456789