Use of quantitative convergent-beam electron diffraction in materials science

被引：0

作者：

Holmestad, R ^{[1
]}

Birkeland, CR

Marthinsen, K

Hoier, R

Zu, JM

机构：

[1] Norwegian Univ Sci & Technol, Dept Phys, N-7491 Trondheim, Norway

[2] Norwegian Univ Sci & Technol, Dept Mat Technol & Electrochem, N-7491 Trondheim, Norway

来源：

MICROSCOPY RESEARCH AND TECHNIQUE | 1999年 / 46卷 / 02期

关键词：

convergent-beam electron diffraction; energy filtering; thickness; lattice parameter; charge density; bonding; TiAl; non-centrosymmetric; phase determination; polarity;

D O I：

10.1002/(SICI)1097-0029(19990715)46:2<130::AID-JEMT6>3.0.CO;2-O

中图分类号：

R602 [外科病理学、解剖学]; R32 [人体形态学];

学科分类号：

100101 ;

摘要：

Methods for quantitative convergent-beam electron diffraction are outlined and some results of our applications of convergent-beam electron diffraction are shown, with emphasis on quantitative analysis of crystal structures in materials science. Examples of thickness measurements and determination of lattice parameters are presented. Measurements of low-order structure factors to obtain information on bonding charge-density distributions are reviewed, with examples from TiAl intermetallics. For non-centrosymmetric crystals, a method to determine three-phase structure invariants is given. Determination of polarity is also discussed. Microsc. Res. Tech. 46:130-145, 1999. (C) 1999 Wiley-Liss, Inc.

引用

页码：130 / 145

页数：16

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